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Work Activities Together with the Advanced Research Center for Nanolithography (ARCNL), the Faculties of Science of the University of Amsterdam and the Vrije Universiteit Amsterdam are organising a...
Work Activities This fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration...
Work Activities Optical metrology is a key ingredient of nanolithography, as it enables the characterization of critical features of nanostructures printed on wafers. High-resolution imaging is an ...
Work ActivitiesOptical metrology is a key ingredient of nanolithography, as it enables the characterization of critical features of nanostructures printed on wafers. High-resolution imaging is an essential part of optical metrology: We need to per...
Work Activities This fully funded PhD position lies at the interface between fundamental physics and industrial application. It is part of a fully funded Consolidator Grant from the European Resear...
Work ActivitiesThis fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration between the Advanced Research Center for Nanolitho...
Work ActivitiesThis fully funded PhD position lies at the interface between fundamental physics and industrial application. It is part of a fully funded Consolidator Grant from the European Research Council titled “Next-Generation Light Source: Dr...
Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a PhD student you will use ...
Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a Postdoctoral Researcher y...
Work ActivitiesAre you interested in simultaneously unraveling the fundamentals of wear and contributing to the solution of friction-related challenges in computer chip production?At the Advanced Research Center for Nanolithography, we work with A...
Work ActivitiesIn semiconductor device manufacturing, metrology tools are required for wafer alignment, overlay and device inspection. As devices become more complicated and as stronger light sources are being used to get sufficient signal from sa...